Transmission Electron Microscopy (TEM) is a high-resolution imaging technique that provides information about the structure and morphology of specimens. It uses a high energy electron beam to penetrate samples and renders images using the transmitted part of the beam. Highly accelerated electrons have a small wavelength; hence, they can be used to resolve small features. This capability is essential in structural biology, nanotechnology and material science studies. The sample to be imaged needs to be placed on a special metal grid, typically covered with ultra-thin (2-5 nm) carbon or polymer support. To ensure the surface support is suitable for use, it has to undergo a glow discharge process first.
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